Solar probes to contact the surface of solar wafer for long life applications

Feinmetall as a reliable partner for contacting solar wafers.
With our innovative technologies and know-how, we have developed special test probes for testing solar modules/wafers.
For the contacting of busbars (conductor paths) on the solar modules, optimized probes are used to contact the sensitive conductor path surfaces without damage. Due to the special design and the very long lifetime of more than 4 million cycles of the contact probes, high-volume solar cell testing is made possible in a cost-efficient way.

Feinmetall is one of the leading suppliers of solar probes.
The new L100 series offers several advantages especially for this sensitive application area in solar wafer contacting :
• Very low & constant contact resistance over the whole lifetime
• Special tip styles for contacting the busbar surface
• Optimized spring characteristics
• Automated 100% function control

Mounting receptacles for solar probes
In order to offer the greatest possible freedom in mounting and wiring, Feinmetall supplies a variety of mounting receptacles (H100)
with different connection options. A wireless connection option directly to a PCB is also possible with our wireless receptacles.
The following connection options are shown in the picture from left to right :
• WW (WireWrap)
• CR (Crimp connection)
• LA (Solder connection)
• WL (Double stroke on PCB)